Emerging Imaging Techniques with One nm Accuracy

https://doi.org/10.55529/jipirs.36.24.26

Authors

  • Dr. Alla Srivani Indian Institute of Technology (IIT Delhi) - INUP Project Vasireddy Venkatadri Institute of Technology- (VVIT) Grigol Robakidze University, Annamali University, India.
  • Gurram Vasanth Indian Institute of Technology (IIT Delhi) - INUP Project Vasireddy Venkatadri Institute of Technology- (VVIT) Grigol Robakidze University, Annamali University, India.
  • M. Srinivasa Rao Indian Institute of Technology (IIT Delhi) - INUP Project Vasireddy Venkatadri Institute of Technology- (VVIT) Grigol Robakidze University, Annamali University, India.
  • Dr. P. Ramesh Indian Institute of Technology (IIT Delhi) - INUP Project Vasireddy Venkatadri Institute of Technology- (VVIT) Grigol Robakidze University, Annamali University, India.

Keywords:

1nm Resolution Accuracy, High level Precision, SHREC.

Abstract

A single dye or a single group of dyes can be localised to within 1-nm accuracy using the fluorescence imaging with one-nanometer accuracy (FIONA) approach. Total internal reflection fluorescence microscopy, oxygen removal techniques, and a high quantum yield, low-noise detector are used to attain this high level of precision. FIONA comes in a variety of forms, some of which have resolutions better than 10 nm. One of these alternatives is single- molecule high-resolution imaging with photo bleaching (SHRIMP), which only needs one kind of dye, such as two green fluorescent proteins (GFPs) or two rhodamines. SHRIMP can only produce high resolution on static systems, though. On the other hand, single-molecule high-resolution colocalization(SHREC) is a FIONA variation that can achieve high resolution in dynamic systems. DOPI, which stands for Defocused Orientation and Positional Imaging, allows the 3-D Orientation.

Published

2023-10-01

How to Cite

Dr. Alla Srivani, Gurram Vasanth, M. Srinivasa Rao, & Dr. P. Ramesh. (2023). Emerging Imaging Techniques with One nm Accuracy . Journal of Image Processing and Intelligent Remote Sensing, 3(06), 24–26. https://doi.org/10.55529/jipirs.36.24.26

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